Omscientific is a representative of Suss Microtec in India.

Metrology Systems

Front to Back Alignment Verification

Double side alignment and exposure is frequently used in the manufacture of MEMS, power devices, integrated optics and PCBs. Top-to-bottom side Measurement Systems from SUSS MicroTec are the ideal tool to verify the alignment of your double side alignment and exposure processes.

DSM200 Gen2
DSM8 Gen2